PhotonIcs and Electromagnetics Research Symposium,
also known as Progress In Electromagnetics Research Symposium
PIERS Proceedings
Published: 2015-07-09
Frequency Characterization of Planar Resonators by THz Josephson Spectroscopy
By
Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9,Page(s)1711-1715
Abstract
Broadband electromagnetic measurement at frequencies above 100 GHz is still chal- lenging problem because of limited frequency ranges of oscillators, complicated matching networks and ambiguous deembedding procedures. It is known that Josephson junction (JJ) is very sensi- tive to electromagnetic environment. Josephson terahertz spectroscopy is based on ac Josephson effect in high-temperature superconducting junctions. Here we extend this method to perform spectral characterization of planar open ring resonators on separate substrates. We have studied resonator characteristics at frequencies from 50 GHz to 700 GHz, using YBa2 Cu3 O7−x high-Tc bicrystal grain boundary junctions on NdGaO3 and MgO substrates. Differential resistance vs. voltage curves modified by the interaction of JJ with resonator have been analyzed. An excitation of fundamental resonance mode in the planar resonator by Josephson oscillations was demon- strated. The technique developed might be used for frequency characterization of THz photonic elements and structures.
Citation
Yuriy Y. Divin, Vladimir N. Gubankov, Irina Gundareva, Valery Pavlovsky, Vadim Pokalyakin, Alexander Snezhko, and Oleg Volkov, "Frequency Characterization of Planar Resonators by THz Josephson Spectroscopy," Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9,Page(s)1711-1715
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