PhotonIcs and Electromagnetics Research Symposium,
also known as Progress In Electromagnetics Research Symposium
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Published by The Electromagnetics Academy
Published: 2015-08-28
Parametric Inversion of 2-D Dielectric Rough Surface Based on SVM
By
Fei Xu,
Qinghe Zhang,
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    Qinghe Zhang

    China Three Gorges University, China

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Qiyuan Zou
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    Qiyuan Zou

    Three Gorges University, China

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Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9，Page(s)246-248
Abstract
The inverse scattering of the geometric parameters with the 2-D rough surface is studied in this paper. Relative parameters are estimated by means of a regression technique based on the use of support vector machines (SVM). The Radar Cross-Section (RCS) is used as feature value, after a proper training procedure, the proposed method is able to reconstruct the parameters of the rough surface. Numerical results are provided for the validation of the approach.
Citation
Fei Xu, Qinghe Zhang, and Qiyuan Zou, "Parametric Inversion of 2-D Dielectric Rough Surface Based on SVM," Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9，Page(s)246-248
References

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