PhotonIcs and Electromagnetics Research Symposium,
also known as Progress In Electromagnetics Research Symposium
PIERS Proceedings
Published: 2015-07-09
Optical Method for Investigation of the Parameters of the Thin Film
By
Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9,Page(s)2042-2045
Abstract
We present results of computer simulation and experimental observation of the Gauss beam reflection from a thin film (an one-dimension photonic crystal). The beam splitting and the beam center of gravity shift were demonstrated after the beam reflection. The shifts were different for s and p-polarization and depended on the angle of incidence, the film thickness and the refractive indices of the film and the substrate. The computer generated intensity distri- butions and experimentally observed ones after the beam reflection were used to determine the film thinkness.
Citation
Natalia D. Kundikova, M. Bolshakov, and Ivan Popkov, "Optical Method for Investigation of the Parameters of the Thin Film," Proceedings of 2015 Photonics & Electromagnetics Research Symposium, Prague, July 6 - 9,Page(s)2042-2045
References